A Self-Test of Dynamically Reconfigurable Processors with Test Frames
URI | http://harp.lib.hiroshima-u.ac.jp/hiroshima-cu/metadata/6025 | ||||||||||||||||||
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E91-D_3 _756.pdf
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Title |
A Self-Test of Dynamically Reconfigurable Processors with Test Frames
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Subject |
dynamically reconfigurable processors
self-test
optimal contexts
test application time
test frames
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Abstract |
This paper proposes a self-test method of coarse grain dynamically reconfigurable processors (DRPs) without hardware overhead. In the method, processor elements (PEs) compose a test frame, which consists of test pattern generators (TPGs), processor elements under test (PEUTs) and response analyzers (RAs), while testing themselves one another by changing test frames appropriately. We design several test frames with different structures, and discuss the relationship of the structures to the numbers of contexts and test frames for testing all the functions of PEs. A case study shows that there exists an optimal test frame which minimizes the test application time under a constraint. |
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Description Peer Reviewed |
有
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Journal Title |
IEICE TRANSACTIONS on Information and Systems
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Volume |
E91-D
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Issue |
3
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Spage |
756
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Epage |
762
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Published Date |
2008-03-01
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Publisher |
電子情報通信学会(IEICE)
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ISSN |
0916-8532
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Language |
eng
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NIIType |
Journal Article
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Text Version |
出版社版
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Rights |
copyright©2008IEICE
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hiroshima-cu
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