Huffman-Based Test Response Coding

URI http://harp.lib.hiroshima-u.ac.jp/hiroshima-cu/metadata/6027
File
Title
Huffman-Based Test Response Coding
Author
氏名 ICHIHARA Hideyuki
ヨミ イチハラ ヒデユキ
別名 市原 英行
氏名 SHINTANI Michihiro
ヨミ シンタニ ミチヒロ
別名 井上 智生
氏名 INOUE Tomoo
ヨミ イノウエ トモオ
別名
Subject
Huffman code
test compression
test response
test application time
ATE
Abstract

Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented.

Description Peer Reviewed
Journal Title
IEICE TRANSACTIONS on Information and Systems
Volume
E88-D
Issue
1
Spage
158
Epage
161
Published Date
2005-01-01
Publisher
電子情報通信学会(IEICE)
ISSN
0916-8532
Language
eng
NIIType
Journal Article
Text Version
出版社版
Rights
copyright©2005 IEICE
Relation URL
Old URI
Set
hiroshima-cu