Test Generation for Test Compression Based on Statistical Coding

URI http://harp.lib.hiroshima-u.ac.jp/hiroshima-cu/metadata/6029
File
Title
Test Generation for Test Compression Based on Statistical Coding
Author
氏名 ICHIHARA Hideyuki
ヨミ イチハラ ヒデユキ
別名 市原 英行
氏名 OGAWA Atsuhiro
ヨミ オガワ アツヒロ
別名 井上 智生
氏名 INOUE Tomoo
ヨミ イノウエ トモオ
別名
氏名 TAMURA Akiko
ヨミ タムラ アキオ
別名
Subject
VLSI test
test compression
statistical code
test generation
automatic test equipment
Abstract

Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time.

Description Peer Reviewed
Journal Title
IEICE TRANSACTIONS on Information and Systems
Volume
E85-D
Issue
10
Spage
1466
Epage
1473
Published Date
2002-10-01
Publisher
電子情報通信学会(IEICE)
ISSN
0916-8532
Language
eng
NIIType
Journal Article
Text Version
出版社版
Rights
copyright©2002IEICE
Relation URL
Old URI
Set
hiroshima-cu