Test Generation for Test Compression Based on Statistical Coding
URI | http://harp.lib.hiroshima-u.ac.jp/hiroshima-cu/metadata/6029 | ||||||||||||||||||||||||
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File |
E85-D_10 _1466.pdf
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Open Date
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Title |
Test Generation for Test Compression Based on Statistical Coding
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Author |
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Subject |
VLSI test
test compression
statistical code
test generation
automatic test equipment
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Abstract |
Test compression/decompression is an efficient method for reducing the test application cost. In this paper we propose a test generation method for obtaining test-patterns suitable to test compression by statistical coding. In general, an ATPG generates a test-pattern that includes don't-care values. In our method, such don't-care values are specified based on an estimation of the final probability of 0/1 occurrence in the resultant test set. Experimental results show that our method can generate test patterns that are able to be highly compressed by statistical coding, in small computational time. |
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Description Peer Reviewed |
有
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Journal Title |
IEICE TRANSACTIONS on Information and Systems
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Volume |
E85-D
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Issue |
10
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Spage |
1466
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Epage |
1473
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Published Date |
2002-10-01
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Publisher |
電子情報通信学会(IEICE)
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ISSN |
0916-8532
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Language |
eng
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NIIType |
Journal Article
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Text Version |
出版社版
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Rights |
copyright©2002IEICE
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Set |
hiroshima-cu
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