On the Effect of Scheduling in Test Generation

URI http://harp.lib.hiroshima-u.ac.jp/hiroshima-cu/metadata/6413
File
Title
On the Effect of Scheduling in Test Generation
Author
氏名 INOUE Tomoo
ヨミ イノウエ トモオ
別名 井上 智生
氏名 MAEDA Hironori
ヨミ マエダ ヒロノリ
別名
氏名 FUJIWARA Hideo
ヨミ フジワラ ヒデオ
別名
Subject
test generation
test generation schedule
fault ordering
fault dominance
cost of testing
Abstract

The order of faults which are targeted for test-pattern generation affects both of the processing time for test generation and the number of generated test-patterns. This order is referred to as a test generation schedule. In this paper, we consider the effect of scheduling in test generation. We formulate the test generation scheduling problem which minimizes the cost of testing. We propose schedulings based on test-pattern generation time, dominating probability and dominated probability, and analyze the effect of these schedulings. In the analysis, we show that the total test-pattern generation time and the total number of test-patterns can be reduced by the scheduling according to the descending order of dominating probability prior to the ascending order of test-pattern generation. This is confirmed by the experiments using ISCAS'85 benchmark circuits. Further, in the experiments, we consider eight schedulings, and show that the scheduling according to the ascending order of dominated probability is the most effective of them.

Description Peer Reviewed
Journal Title
IEICE TRANSACTIONS on Information and Systems
Volume
E79-D
Issue
8
Spage
1190
Epage
1197
Published Date
1996-08-20
Publisher
社団法人電子情報通信学会
ISSN
0916-8532
Language
eng
NIIType
Journal Article
Text Version
出版社版
Rights
copyright©1996 IEICE
Relation URL
Old URI
Set
hiroshima-cu