In order to explore local- and intermediate-range atomic structures on some semiconducting and metallic glasses, anomalous x-ray scattering (AXS) experiments were performed using an improved detecting system suitable for a third-generation synchrotron radiation facility, ESRF, Grenoble, France, and the obtained data were analyzed using reverse Monte Carlo (RMC) modeling to obtain partial structure factors and to construct three-dimensional atomic configurations of these glasses. Some examples of semiconducting and metallic glasses are demonstrated to show the feasibility of the combination of the AXS and RMC techniques.