CrxY(Y=S,Se,Te)の共鳴逆光電子分光
URI | http://harp.lib.hiroshima-u.ac.jp/kure-nct/metadata/8419 | ||||||||||||||||||||||||
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ファイル |
kenkyu[70]-2.pdf
( 307.0 KB )
公開日
:2011-02-28
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タイトル |
CrxY(Y=S,Se,Te)の共鳴逆光電子分光
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別タイトル |
Resonant inverse-photoemission studies of CrxY (Y=S,Se,Te)
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著者 |
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キーワード |
Cr-chalcogenide
Resonant photomission
Resonant inverse-photomission
Electronic structure
クロム―カルコゲン化合物
共鳴光電子分光
共鳴逆光電子分光
電子構造
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抄録 |
Electronic density of states of CxY(Y=S,Se,Te)with a NiAs-type structure are obtained from resonant photoemission and resonant inverse-photoemission spectroscopies measurements in the regions of the valence band maximum (VBM) and conduction band minimum (CBM). The Cr 3d(t2g) exchange splitting energies of CrxS,CrxSe and CrxTe are determined to be 3.5, 3.5 and 3.8 eV, respectively. It is worthwhile to notice that a Cr 3d(t2g) exchange splitting energy becomes larger as chalcogen changes from S to Se and further to Te. This tendency is similar to the exchange splitting energies calculated by Dijkstra et al.. Cr 3d main peaks locate at almost same positions whether Cr vacancies exit or not in the Cr chalcogenides. Therefore, it seems that Cr vacancies do not affect strongly on the electronic structures of the compounds. |
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掲載雑誌名 |
呉工業高等専門学校研究報告
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号 |
70
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開始ページ |
15
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終了ページ |
19
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出版年月日 |
2008
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出版者 |
呉工業高等専門学校
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ISSN |
0286-4037
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本文言語 |
日本語
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資料タイプ |
紀要論文
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著者版フラグ |
出版社版
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旧URI | |||||||||||||||||||||||||
区分 |
kure-nct
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